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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Pern, F.J. Yan, F. Mansfield, L. Glynn, S. Rekow, M. Murison, R. |
| Copyright Year | 2011 |
| Description | Author affiliation: ESI-PyroPhotonics Lasers, Inc., 1275 Kesmark, Dollard-des-Ormeaux, QC Canada H9B 3J1 (Rekow, M.; Murison, R.) || National Center for Photovoltaics, National Renewable Energy Laboratory, 1617 Cole Blvd., Golden, CO 80401, USA (Pern, F.J.; Yan, F.; Mansfield, L.; Glynn, S.) |
| Abstract | We employed current-voltage (I-V), quantum efficiency (QE), photoluminescence (PL), electroluminescence (EL), lock-in thermography (LIT), and (electrochemical) impedance spectroscopy (ECIS) to complementarily characterize the performance and remedy for two pairs of experimental CuInGaSe (CIGS) mini-modules. One pair had the three scribe-lines (P1/P2/P3) done by a single pulse-programmable laser, and the other had the P2/P3 lines by mechanical scribe. Localized QE measurements for each cell strip on all four mini-modules showed non-uniform distributions that correlated well with the presence of performance-degrading strips or spots revealed by PL, EL, and LIT imaging. Performance of the all-laser-scribed mini-modules improved significantly by adding a thicker Al-doped ZnO layer and reworking the P3 line. The efficiency on one of the all-laser-scribed mini-modules increased notably from 7.80% to 8.56% after the performance-degrading spots on the side regions along the cell array were isolated by manual scribes. |
| Starting Page | 002792 |
| Ending Page | 002797 |
| File Size | 274417 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424499663 |
| ISSN | 01608371 |
| e-ISBN | 9781424499656 |
| DOI | 10.1109/PVSC.2011.6186526 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-06-19 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Strips Manuals Resistance Lasers Imaging Curve fitting Measurement by laser beam |
| Content Type | Text |
| Resource Type | Article |
| Subject | Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering |
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