NDLI: Detection of ZnS phases in CZTS thin-films by EXAFS

Content Provider	IEEE Xplore Digital Library
Author	Hartman, K. Newman, B.K. Johnson, J.L. Hui Du Fernandes, P.A. Chawla, V. Bolin, T. Clemens, B.M. da Cunha, A.F. Teeter, G. Scarpulla, M.A. Buonassisi, T.
Copyright Year	2011
Description	Author affiliation: Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA (Bolin, T.) \|\| National Renewable Energy Laboratory, Golden, CO, USA (Hui Du; Teeter, G.) \|\| Massachusetts Institute of Technology, Cambridge, MA, USA (Hartman, K.; Newman, B.K.; Buonassisi, T.) \|\| University of Aveiro, Aveiro, Portugal (Fernandes, P.A.; da Cunha, A.F.) \|\| University of Utah, Salt Lake City, UT, USA (Johnson, J.L.; Scarpulla, M.A.) \|\| Stanford University, Stanford, CA, USA (Chawla, V.; Clemens, B.M.)
Abstract	Copper zinc tin sulfide (CZTS) is a promising Earth-abundant thin-film solar cell material; it has an appropriate band gap of ∼1.45 eV and a high absorption coefficient. The most efficient CZTS cells tend to be slightly Zn-rich and Cu-poor. However, growing Zn-rich CZTS films can sometimes result in phase decomposition of CZTS into ZnS and Cu, which is generally deleterious to solar cell performance. Cubic ZnS is difficult to detect by XRD, due to a similar diffraction pattern. We hypothesize that synchrotron-based extended X-ray absorption fine structure (EXAFS), which is sensitive to local chemical environment, may be able to determine the quantity of ZnS phase in CZTS films by detecting differences in the second-nearest neighbor shell of the Zn atoms. Films of varying stoichiometries, from Zn-rich to Cu-rich (Zn-poor) were examined using the EXAFS technique. Differences in the spectra as a function of Cu/Zn ratio are detected. Linear combination analysis suggests increasing ZnS signal as the CZTS films become more Zn-rich. We demonstrate that the sensitive technique of EXAFS could be used to quantify the amount of ZnS present and provide a guide to crystal growth of highly phase pure films.
Starting Page	002506
Ending Page	002509
File Size	1368693
Page Count	4
File Format	PDF
ISBN	9781424499663
ISSN	01608371
e-ISBN	9781424499656
DOI	10.1109/PVSC.2011.6186455
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-19
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Films Zinc Copper Absorption X-ray scattering Atomic measurements Photovoltaic cells
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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