NDLI: System for spectral characterization of solar cell structures

Content Provider	IEEE Xplore Digital Library
Author	Ciocan, R. Han, D. Assalone, D. Li, Z. Ciocan, E. Lloyd, M. Moriarty, T. Emery, K. Wu, J. Lee, S. Mangham, S. Vanga, R. Manasreh, M.O.
Copyright Year	2011
Description	Author affiliation: National Renewable Energy Laboratory, Golden, CO, USA (Lloyd, M.; Moriarty, T.; Emery, K.) \|\| University of Arkansas, Fayetteville, AR, USA (Wu, J.; Lee, S.; Mangham, S.; Vanga, R.; Manasreh, M.O.) \|\| Oriel Instruments, Newport Corporation, Stratford, CT, USA (Ciocan, R.; Han, D.; Assalone, D.; Li, Z.) \|\| Clark University, Worcester, MA USA (Ciocan, E.)
Abstract	The spectral characterization system presented in this work is one based on a monochromator and it is able to deliver an under — millimeter spot size. The system is fully controlled by computer, shows good repeatability and high accuracy in spectral characterization of photovoltaic devices by the determination of internal quantum efficiency over an extended wavelength range. Two solutions for extended range detectors are explored in this study: pyroelectric and sandwich detectors. Most of the results shown in this abstract were obtained using a pyroelectric detector. The full version of the paper will show a comparison between the two types of detectors. Scanning images (maps) of internal quantum efficiency (IQE) and of external quantum efficiency (QE) can be obtained with high spatial resolution both in AC and DC mode. I-V curves can be obtained in monochromatic or white light in the same location as the IQE curves without a supplemental repositioning. Because IQE curves and I-V curves are obtained in the same location and using the same optics, a full characterization of the photovoltaic device under test is possible in a single run.
Starting Page	001734
Ending Page	001738
File Size	255760
Page Count	5
File Format	PDF
ISBN	9781424499663
ISSN	01608371
e-ISBN	9781424499656
DOI	10.1109/PVSC.2011.6186289
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-19
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Detectors Reflectivity Photovoltaic systems Photovoltaic cells Junctions Optical reflection
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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