NDLI: Noise induced timing jitter: a general restriction for high speed RSFQ devices

Content Provider	IEEE Xplore Digital Library
Author	Ortlepp, T. Uhlmann, F.H.
Copyright Year	2002
Abstract	All complex devices in rapid single flux quantum (RSFQ) technique work at much lower clock rates than possible for simple cells. New data driven self timed or asynchronous concepts can reduce this gap, but even in this case still a discrepancy between simulation and experiment is shown. It has been pointed out in previous studies, that the influence of thermal fluctuations in RSFQ circuits is divided into static and dynamic switching bit errors as well as timing jitter induced failures. The bit error rate depends exponentially on the temperature and is not the main issue in the low temperature technique. Our last results show for the first time, that the variance of the switching time is much slower decreased by reducing the temperature and is still important at 4.2 K. We describe a general method for calculating the switching time distribution for RSFQ cells. Furthermore, we present detailed results for a timing analysis of a dc/SFQ-converter. The delay between output signal and the input current ramp shows a variation over 1 ps which is more than 10% of the switching time itself. This new understanding of the background of timing jitter enables a goal-oriented improvement in the design process of RSFQ circuits.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	344
Ending Page	347
Page Count	4
File Size	224834
File Format	PDF
ISSN	10518223
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Timing jitter Temperature dependence Clocks Circuit simulation Fluctuations Switching circuits Bit error rate Temperature distribution Delay effects Process design timing jitter Bit-error-rate noise superconducting devices
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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