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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Palau, A. Puig, T. Obradors, X. Feenstra, R. Freyhardt, H.C. |
| Copyright Year | 2002 |
| Abstract | We present a comparative analysis on tensile strain tolerance of critical currents for IBAD and RABiTS coated conductors. These measurements have been performed with a recently developed methodology based on dc-magnetization measurements, which enables us to analyze the grain and grain-boundary critical current densities simultaneously. We show that the percolative grain-boundary critical current density may be reduced by 50% with deformations of /spl epsiv//spl sim/0.32% and 1% for RABiTS and IBAD, respectively, while the grain critical current and thus the pinning properties of the grains are not affected by the deformation process. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 2790 |
| Ending Page | 2793 |
| Page Count | 4 |
| File Size | 503191 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 15 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Capacitive sensors Critical current Yttrium barium copper oxide Conductors Density measurement Current measurement Critical current density Tensile strain Performance evaluation Performance analysis strain tolerance Coated conductor critical current deformation process |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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