NDLI: Effects of spatial nonuniformity of superconducting-tunnel-junction ion detectors on mass spectroscopy

Content Provider	IEEE Xplore Digital Library
Author	Ohkubo, M. Ukibe, M. Saito, N. Kushino, A. Ichimura, S. Friedrich, S.
Copyright Year	2002
Abstract	Spatial uniformity of superconducting tunnel junction detectors with a size of 200 /spl mu/m is improved by increasing Al thickness of the Nb/Al proximized electrodes in an energy range of 5-10 keV. which is in the same order as an acceleration energy in time-of-flight mass spectroscopy (TOF-MS). It has been confirmed in the TOF experiments with Ta ions and Ta clusters that the proximized junction detectors clearly separate different ionic states and multi-hit events in impact energy spectra, and moreover can reveal the difference in ion species or ion-surface collision dynamics. However, a better spatial uniformity is not always good for TOF-MS, possibly because a detector with the thicker Al layers has a lower superconducting energy gap, which results in an improper detector operation because of a temperature rise due to heat radiation, or the states of the detector surfaces are different.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	932
Ending Page	935
Page Count	4
File Size	116527
File Format	PDF
ISSN	10518223
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Mass spectroscopy Josephson junctions Radiation detectors Superconducting epitaxial layers Ion sources Semiconductor counters Electrodes Acceleration Temperature Energy measurement superconductor-insulator-superconductor devices particle detectors superconducting radiation detectors
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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