NDLI: Fabrication and characteristics of multi-terminal SINIS devices

Content Provider	IEEE Xplore Digital Library
Author	Nevirkovets, I.P. Chernyashevskyy, O. Ketterson, J.B.
Copyright Year	2002
Abstract	We fabricated and measured multi-terminal SINIS devices (where S, I, and N denote a superconductor, an insulator, and a normal metal, respectively) with the Nb/Al/AlO/sub x//Al/AlO/sub x//Al/Nb structure. The multilayered SINIS structure was fabricated in-situ using sputter deposition of Nb and Al, and thermal oxidation of the Al layers to grow the tunnel barriers. Devices with a characteristic size of about 10 /spl mu/m were formed via an optical-lithography process that included making an electrical contact to the middle Al layer (16-19 nm thick). Current-voltage characteristics of the devices were measured in different modes (i. e., by feeding the current across the whole device, through each of the junctions, and through the middle Al film) at low temperatures (1.4-4.2 K). Specifically, the devices were tested in a transistor-like configuration to explore the influence of current injection through a SIN junction and the N film on the Josephson critical current and quasiparticle characteristic of the SINIS junction as a whole, and on the characteristics of the second junction.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	129
Ending Page	132
Page Count	4
File Size	189110
File Format	PDF
ISSN	10518223
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fabrication Niobium Optical films Insulation Metal-insulator structures Sputtering Oxidation Optical devices Contacts Current-voltage characteristics superconducting devices Josephson device fabrication Josephson effect multilayers
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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