NDLI: Continuous deposition of thermally co-evaporated YBCO/CeO/sub 2//Ni coated conductors

Content Provider	IEEE Xplore Digital Library
Author	Gauzzi, A. Bindi, M. Gianni, L. Ginocchio, S. Zannella, S. Baldini, A. Holzapfel, B. Bolzoni, F.
Copyright Year	2002
Abstract	By using a simple single-pass reel-to-reel system, we demonstrate a simple and robust in-situ route for the continuous deposition of 1-2 m long Coated Conductors (CC) consisting of 1 /spl mu/m thick superconducting YBa/sub 2/Cu/sub 3/O/sub 7/ (YBCO) films deposited by thermal co-evaporation onto 100 nm thick CeO/sub 2/ buffered cube textured Ni tapes. The buffer layer was deposited by either e-beam or thermal evaporation using respectively ceria or metallic cerium. The structural and morphological properties of the samples were investigated by X-ray /spl thetav/-2/spl thetav/ Bragg-Brentano, and pole figure diffraction, Nomarsky optical microscopy and Scanning Electron Microscopy (SEM) analysis. The 123 composition was controlled during deposition by means of an atomic absorption system. The optimized buffer layer and YBCO layer are grown at 690/spl deg/C in respectively forming gas and oxygen partial pressures of 5/spl times/10/sup -5/ mbar. These conditions ensure the growth of dense and crack-free layers with good biaxial texture, as indicated by FWHM's values in the 5-7/spl deg/ range for both in- and out-of-plane orientations. Zero-resistance critical temperatures T/sub c/=86-87 K with transition widths /spl Delta/T/sub c/<3 K are reproducibly obtained. End-to-end critical current densities J/sub c/ at 77 K and self-field typically are in the 1.5-2.5 MA/cm/sup 2/ range, as measured by transport measurements. It is found that tape motion does not significantly affect these properties.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2628
Ending Page	2631
Page Count	4
File Size	1245104
File Format	PDF
ISSN	10518223
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Yttrium barium copper oxide Optical microscopy Scanning electron microscopy Conductive films Superconducting films Optical buffering Buffer layers Density measurement Current measurement Robustness YBCO continuous deposition thermal co-evaporation
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

High J/sub C/ YBCO films on biaxially textured Ni with oxide buffer layers deposited using evaporation and sputtering techniques

Sol-gel processing of buffer layers on Ni tape for YBCO surface coated conductors

Growth and characterization of oxide buffer layers for YBCO coated conductors

Use of SrTiO/sub 3/ as a single buffer layer for RABiTS YBCO coated conductor

YBCO films and CeO/sub 2//YSZ/CeO/sub 2/ buffer layers grown on Ni-Cr-W RABiTS with a Pd seed layer

Development of MOCVD Technology for Integrated YBCO Layer/Buffer Layer Fabrication for Coated Conductors

Development of Solution Buffer Layers for RABiTS Based YBCO Coated Conductors

Microstructure Analysis of High-Quality Buffer Layers on Textured NiW Tapes for YBCO Coated Conductors

Fast Growth Processes of Buffer Layers for YBCO Coated Conductors on Biaxially-Textured Ni Tapes

Continuous deposition of thermally co-evaporated YBCO/CeO/sub 2//Ni coated conductors

Similar Documents

High J/sub C/ YBCO films on biaxially textured Ni with oxide buffer layers deposited using evaporation and sputtering techniques

Sol-gel processing of buffer layers on Ni tape for YBCO surface coated conductors

Growth and characterization of oxide buffer layers for YBCO coated conductors

Use of SrTiO/sub 3/ as a single buffer layer for RABiTS YBCO coated conductor

YBCO films and CeO/sub 2//YSZ/CeO/sub 2/ buffer layers grown on Ni-Cr-W RABiTS with a Pd seed layer

Development of MOCVD Technology for Integrated YBCO Layer/Buffer Layer Fabrication for Coated Conductors

Development of Solution Buffer Layers for RABiTS Based YBCO Coated Conductors

Microstructure Analysis of High-Quality Buffer Layers on Textured NiW Tapes for YBCO Coated Conductors

Fast Growth Processes of Buffer Layers for YBCO Coated Conductors on Biaxially-Textured Ni Tapes

Continuous deposition of thermally co-evaporated YBCO/CeO/sub 2//Ni coated conductors