NDLI: Shaping of melt textured samples for fault current limiters

Content Provider	IEEE Xplore Digital Library
Author	Harnois, C. Meslin, S. Noudem, J.G. Chateigner, D. Ouladdiaf, B. Chaud, X.
Copyright Year	2002
Abstract	Resistive fault current limiters require long length of superconducting materials with relatively low sections. Meander is now a frequently used geometry for this type of application. Nevertheless, the shaping of a textured sample is a quite delicate operation because of its brittle character. Cracks are often observed in the final meander and reduce the life time of these samples. Recently, we have presented a new process that allows overcoming this problem. Sintered pellets are drilled to adopt the chosen geometry. Then, the texturing process is performed. By this way, no large mechanical stresses are applied to the fragile textured samples. Here, the idea is to reproduce the meander pattern. Holes performed do not cross the whole sample thickness but alternatively emerge from top or bottom of the pellet. Slices extracted from the textured samples face like meanders. Different geometries have been tested with holes emerging perpendicular to the (ab) planes or parallel to the (ab) planes. The annealing time under oxygen flow has been studied to fit the required critical current densities values, which were evaluated through transport measurements at 77 K. SEM studies allow comparing both configurations and in particular the crack existence. The quality of the textured material around the holes was found to be not deteriorated compared to the bulk microstructure. Finally, the influence of the holes on the texture quality was studied by neutron diffraction.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3094
Ending Page	3097
Page Count	4
File Size	880976
File Format	PDF
ISSN	10518223
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault current limiters Geometry Superconducting materials Stress Testing Annealing Critical current density Density measurement Current measurement Fluid flow measurement yttrium compounds High-temperature superconductors superconducting materials growth superconducting materials measurements
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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