NDLI: Capacitive properties of YBa/sub 2/Cu/sub 3/O/sub 7/ grain boundary Josephson junctions fabricated on 45/spl deg/ [100] tilt asymmetric and 24/spl deg/ [001] tilt symmetric bicrystals

Content Provider	IEEE Xplore Digital Library
Author	Navacerrada, M.A. Lucia, M.L. Sanchez-Soto, L.L. Sanchez-Quesada, F. Sarnelli, E. Testa, G.
Copyright Year	2002
Abstract	We present a comparative study of the electromagnetic parameters, mainly focused in the analysis of the capacitance (C) associated to the barrier, of YBa/sub 2/Cu/sub 3/O/sub 7-x/ (YBCO) grain boundary Josephson junctions (GBJJs) fabricated on 24/spl deg/ [001] symmetric and 45/spl deg/ [100] asymmetric tilt bicrystalline substrates. The Swihart velocity (c~) is slightly affected by the nature of the barrier and mainly fixed by the junction width. However, a notable influence of the barrier structure, so of the geometry of the bicrystal substrate, on the relative dielectric constant to the barrier thickness ratio (/spl epsiv//sub r//t) values, so on C, has been found. We have observed that the capacitance values deduced by means of Fiske steps in YBCO 24/spl deg/ [001] symmetric and 45/spl deg/ [100] asymmetric GBJJs scale with junction resistance in opposite direction. This result could reveal the presence of a tunnel barrier in the YBCO 45/spl deg/ [100] asymmetric GBJJs. On the other hand, different capacitance values have been obtained by means of Fiske steps and hysteresis observed in the current-voltage characteristics in 45/spl deg/ [100] asymmetric GBJJs. An interpretation of this result can be made taking into account the contribution of the depleted YBCO layers close to the crystallographic grain boundary.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	169
Ending Page	172
Page Count	4
File Size	165675
File Format	PDF
ISSN	10518223
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Yttrium barium copper oxide Capacitance Grain boundaries Dielectric substrates Electromagnetic analysis Josephson junctions Geometry Dielectric constant Hysteresis Current-voltage characteristics weak links Josephson effects proximity effects tunneling phenomena
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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