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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Herr, Q.P. Johnson, M.W. |
| Copyright Year | 2002 |
| Abstract | Noise-induced bit error rate (BER) is an important design constraint for RSFQ circuits. No method, however, has been reported to calculate the BER of real, multi-junction RSFQ gates. We report such a method that requires only the operating margins and the root-mean-square noise current of the device in question. Noise current is determined using the ".ac" analysis card built into SPICE circuit simulators. As usual, operating margins are also determined using SPICE. These quantities determine BER via the error function, as is appropriate for threshold dynamics. The method is general enough to be applied to any RSFQ gate and even exotic circuits such as those that use passive microstrip signal propagation. Comparison to experimental data indicates that BER in RSFQ circuits does indeed arise strictly from thermal noise. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 531 |
| Ending Page | 534 |
| Page Count | 4 |
| File Size | 533853 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 13 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Circuit noise Circuit analysis Bit error rate SPICE Circuit simulation Josephson junctions Superconducting device noise Microstrip Clocks Testing |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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