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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Cherpak, Y.V. Komashko, V.A. Pozigun, S.A. Semenov, A.V. Tretiatchenko, C.G. Pashitskii, E.A. Pan, V.M. |
| Copyright Year | 2002 |
| Abstract | Magnetic field and angle dependencies of critical current density J/sub c/(H,/spl theta/) are measured for single-crystal c-oriented epitaxial YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin films with high J/sub c//spl ap/2 MA/cm/sup 2/ at 77 K. Films are deposited by off-axis dc magnetron sputtering onto r-cut sapphire substrates buffered with CeO/sub 2/. Experimental evidences of the dominant contribution of extended linear defects (growth-induced out-of-plane edge dislocations) to pinning mechanism and critical current behavior are presented. A consistent model of vortex lattice depinning from a linear defect system is developed. Detailed J/sub c/(H) measurements start from very low fields (<0.001 T). Qualitatively different angle dependencies J/sub c/(/spl theta/) are obtained in different field ranges. Their evolution is comprehended on the base of depinning model. The "peak-effect" observed in J/sub c/(H)-dependencies at parallel magnetic field is discussed as a contribution of electromagnetic pinning. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 2783 |
| Ending Page | 2786 |
| Page Count | 4 |
| File Size | 235253 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 15 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Critical current density High temperature superconductors Yttrium barium copper oxide Transistors Magnetic field measurement Sputtering Density measurement Current measurement Magnetic films Substrates Y-Ba-Cu-O superconductor Critical current crystal defects nano-structure thin films vortex pinning |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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