NDLI: Critical current determination of artificially welded HTS samples by in-field Hall mapping technique

Content Provider	IEEE Xplore Digital Library
Author	Granados, X. Bozzo, B. Iliescu, S. Bartolome, E. Puig, T. Obradors, X. Amoros, J. Carrera, M.
Copyright Year	2002
Abstract	The direct observation of the magnetic field at the surface of SC samples when the field is applied or in the remanent state, allows the observation of the current distribution along the magnetization loop by using inverse problem solvers. Furthermore, the mean value of the field reflects well the magnetization of the sample obtaining the magnetization loop taken in account both possibilities, the In-Field Hall Mapping technique, thus, has revealed as a powerful characterization technique. This technique can be improved by including the critical state simulation, giving so a very complete way to characterize artificially welded superconducting samples, thus allowing the identification of the critical current flowing through the surface between domains as is the case of the effect of welded bulks. Some examples of the characterization procedures are reported.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3632
Ending Page	3635
Page Count	4
File Size	775674
File Format	PDF
ISSN	10518223
Volume Number	15
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Critical current Welding High temperature superconductors Magnetization Superconducting magnets Magnetic field measurement Current distribution Inverse problems Yttrium barium copper oxide Gaussian processes superconductors characterization Magnetic remanence currents superconducting welding
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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