NDLI: Suppression of extrinsic resolution limiting factors in epitaxial superconducting tunnel junction detectors

Content Provider	IEEE Xplore Digital Library
Author	Porter, F.S. Van Vechten, D. Blamire, M.G. Kirk, E.C.G.
Copyright Year	2002
Abstract	Superconducting tunnel junctions have been shown to have potential as high resolution X-ray detectors. Recent reductions in the noise environment of our experiment have yielded a substantial increase in the resolution of our Nb/Ta junctions. The junctions used in the experiment are epitaxial base layer devices including a thick Ta absorber and have survived more than 30 cycles to low temperatures. Current experiments with a /sup 55/Fe source have yielded an energy resolution of 68 eV at 5.89 keV with a quantum efficiency of 13%. Additional measurements using a higher energy /sup 109/Cd source are also reported. We discuss how a reduction of extrinsic and quasi-extrinsic noise sources affects the performance of the detectors and why we believe we are still not observing the intrinsic limitations of these junctions.<>
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3026
Ending Page	3029
Page Count	4
File Size	453049
File Format	PDF
ISSN	10518223
Volume Number	5
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Superconducting epitaxial layers Josephson junctions Semiconductor counters Superconducting device noise Noise reduction Energy resolution X-ray detectors Working environment noise Niobium Temperature
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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