NDLI: Investigation of low injection effects using the local ideality factor obtained from effective lifetime measurements

Content Provider	IEEE Xplore Digital Library
Author	Hameiri, Z. Fa-Jun Ma McIntosh, K.R.
Copyright Year	2014
Description	Author affiliation: PV Lighthouse, Coledale, NSW, Australia (McIntosh, K.R.) \|\| Solar Energy Res. Inst. of Singapore, Nat. Univ. of Singapore, Singapore, Singapore (Hameiri, Z.; Fa-Jun Ma)
Abstract	The effective minority carrier lifetime of p-type silicon wafers passivated by silicon nitride and of n-type silicon wafers passivated by aluminum oxide often decreases significantly as the excess carrier concentration decreases. Several theories have been postulated to explain this effect. The main ones are asymmetric carrier lifetimes, high recombination within a surface damage region, and edge recombination. As in some cases the effective lifetime measurements can be fitted quite well by all these effects, it is challenging to determine which of them limits the low injection performance of a specific wafer. This study demonstrates that although these mechanisms affect the lifetime in ways that are difficult to be distinguished, they have a significantly different influence on the resulting injection-dependent local ideality factor. It is therefore suggested that the injection dependent local ideality factor can be used to distinguish between these mechanisms.
Starting Page	1842
Ending Page	1847
File Size	742927
Page Count	6
File Format	PDF
e-ISBN	9781479943982
DOI	10.1109/PVSC.2014.6925282
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-06-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Spontaneous emission Silicon Semiconductor device modeling Mathematical model Surface treatment Photovoltaic cells Charge carrier processes photovoltaic cells charge carrier lifetime charge carrier density semiconductor device modeling
Content Type	Text
Resource Type	Article

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