NDLI: Structural studies of light-induced anodic aluminum oxide

Content Provider	IEEE Xplore Digital Library
Author	Zi Ouyang Jie Cui Yang Li Zhongtian Li Lennon, A.
Copyright Year	2014
Description	Author affiliation: Sch. of Photovoltaic & Renewable Energy Eng., Univ. of New South Wales, Sydney, NSW, Australia (Zi Ouyang; Jie Cui; Yang Li; Zhongtian Li; Lennon, A.)
Abstract	Light-induced anodisation (LIA) is an innovative method to produce oxide films on the surface of crystalline silicon solar cells in an inexpensive electrochemical bath under light illumination. LIA of aluminum to form anodic aluminium oxide (AAO) has been demonstrated to provide excellent passivation and anti-reflection effects.. This article reports on recent studies on the structural properties of AAO layers using ellipsometry, microscope, and a few modelling techniques. The effects of the light intensity and the thickness of the aluminum (Al) precursor on the refractive index, porosity and barrier layer thickness of the AAO films are revealed. The effects of the applied voltage on the AAO growth rate are investigated. All the studies are served to provide a guideline to quick formation of uniform AAO layers for effective passivation and anti-reflection.
Starting Page	1234
Ending Page	1237
File Size	747676
Page Count	4
File Format	PDF
e-ISBN	9781479943982
DOI	10.1109/PVSC.2014.6925138
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-06-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Aluminum oxide Refractive index Silicon Ellipsometry Films Passivation photovoltaic solar cell light induced anodisation anodic aluminium oxide ellipsometry silicon
Content Type	Text
Resource Type	Article

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