NDLI: XPS analysis and structural characterization of CZTS thin films prepared using solution and vacuum based deposition techniques

Content Provider	IEEE Xplore Digital Library
Author	Hurtado, M. Cruz, S.D. Becerra, R.A. Calderon, C. Bartolo-Perez, P. Gordillo, G.
Copyright Year	2014
Description	Author affiliation: Fac. de Cienc. Fisico Mat., Univ. Autonoma de Nuevo Leon, Monterrey, Mexico (Cruz, S.D.) \|\| Dept. de Quim., Univ. Nac. de Colombia, Bogota, Colombia (Hurtado, M.; Becerra, R.A.) \|\| Dept. de Fis. Aplic., CINVESTAV-IPN, Mérida, Mexico (Bartolo-Perez, P.) \|\| Dept. de Fis., Univ. Nac. de Colombia, Bogota, Colombia (Calderon, C.; Gordillo, G.)
Abstract	This work describes a procedures to grow single phase $Cu_{2}ZnSnS_{4}$ (CZTS) thin films with tetragonal-kesterite type structure, using solution and vacuum based deposition techniques. The solution based deposition approach involves sequential deposition of $Cu_{2}SnS_{3}$ (CTS) and ZnS films, where the CTS compound is synthesized in one step process by simultaneous precipitation of Cu2S and $SnS_{2}$ performed by diffusion membranes assisted CBD technique and the vacuum based approach includes sequential evaporation of the elemental metallic precursors under a flux of sulphur supplied from an effusion cell. X-ray diffraction analysis (XRD) which is mostly used for the phase identification can not clearly distinguish the formation of secondary phases such as $Cu_{2}SnS_{3},$ since both compounds have the same diffraction pattern; therefore the use of a complementary technique is needed. Raman scattering analysis was used to distinguish these phases. Further, the chemical elemental composition and oxidation states of both type of CZTS films were studied by X-ray photoelectron spectroscopy (XPS) analysis.
Starting Page	0368
Ending Page	0372
File Size	778454
Page Count	5
File Format	PDF
e-ISBN	9781479943982
DOI	10.1109/PVSC.2014.6924934
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-06-08
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Zinc Tin X-ray scattering Films Compounds Photovoltaic cells Raman scattering XPS Thin films Cu2ZnSnS4 diffusion membranes assisted CBD Raman XRD
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in