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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Jian Zhou Jinyi Qi |
| Copyright Year | 2010 |
| Description | Author affiliation: Department of Biomedical Engineering, University of California, Davis, CA 95616, USA (Jian Zhou; Jinyi Qi) |
| Abstract | We have proposed a “zoom-in” PET system that integrates a higher-resolution detector capable of measuring depth of interaction (DOI) into an existing scanner to obtain highresolution images of a targeted region with high-sensitivity. The system acquires coincidence events between the high-resolution detector and low-resolution detectors, as well as those between the low-resolution detectors. Because of the irregular system geometry and the use of a DOI detector, the system matrix of the zoom-in PET system requires far greater storage space than that of a conventional PET scanner, which also results in long computational time for image reconstruction. To address this issue, here we propose a system matrix factorization for the zoom-in PET to reduce the storage and computational cost while maintaining the accuracy in image reconstruction. The proposed factored system matrix consists of two major components: a detector response (or sinogram blurring) matrix and a geometrical projection matrix. We present a novel method to design the geometrical component and an iterative algorithm to estimate the detector response matrix. A 2D simulation study showed that the proposed method can reduce the storage space and reconstruction time by a factor of 5 without noticeable sacrifice in image quality. |
| Starting Page | 3501 |
| Ending Page | 3505 |
| File Size | 528516 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781424491063 |
| ISSN | 10957863 |
| e-ISBN | 9781424491056 |
| DOI | 10.1109/NSSMIC.2010.5874457 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-10-30 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Detectors Positron emission tomography Image reconstruction Noise measurement Image resolution Geometry Bismuth |
| Content Type | Text |
| Resource Type | Article |
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