NDLI: Spatial resolution performance evaluation of a monolithic crystal PET detector with Cramer-Rao lower bound (CRLB)

Content Provider	IEEE Xplore Digital Library
Author	Xiaoli Li Hunter, W.C.J. Lewellen, T.K. Miyaoka, R.S.
Copyright Year	2010
Description	Author affiliation: University of Washington Department of Radiology, Seattle, WA USA (Hunter, W.C.J.; Lewellen, T.K.; Miyaoka, R.S.) \|\| University of Washington Department of Physics, Seattle, WA USA (Xiaoli Li)
Abstract	We have previously reported on continuous miniature crystal element (cMiCE) PET detectors that provide depth of interaction (DOI) positioning capability. A key component of the design is the use of a statistics based positioning (SBP) method for 3D event positioning. The Cramer-Rao lower bound (CRLB) expresses a lower bound on the variance of estimators for a deterministic parameter. Therefore, the CRLB could be used to evaluate whether our SBP algorithm is efficient and to quickly determine the best possible spatial resolution when investigating new detector designs. In this work, the CRLB is first reported based upon experimental results from a PET detector using a 50 mm by 50 mm by 15 mm LYSO crystal readout by a 64-channel PMT on the exit surface of the crystal. The X/Y spatial resolution is very close to the CRLB, while the depth of interaction (DOI) resolution is more than double the CRLB even after correcting for beam size and finite X resolution of the detector. A simulation study was conducted to investigate what causes the difference between measured DOI resolution and the CRLB for DOI. The PET detector was modeled as a 50 mm by 50 mm by 15 mm LYSO crystal readout by a 64-channel SiPM array placed on the entrance surface of the crystal. The results show that Compton scatter in the crystal degrades the DOI resolution. A second interesting result was that the DOI CRLB could not be achieved even when tested using only photoelectric events. This is because of the limitations of the DOI decoding algorithm.
Starting Page	2202
Ending Page	2205
File Size	609868
Page Count	4
File Format	PDF
ISBN	9781424491063
ISSN	10957863
e-ISBN	9781424491056
DOI	10.1109/NSSMIC.2010.5874173
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-10-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Spatial resolution Crystals Detectors Calibration Positron emission tomography Algorithm design and analysis Clustering algorithms
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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