NDLI: A 5MHz low-noise 130nm CMOS analog front-end electronics for the readout of non-linear DEPFET sensor with signal compression for the European XFEL

Content Provider	IEEE Xplore Digital Library
Author	De Vita, G. Bombelli, L. Porro, M. Herrmann, S. Wassatsch, A. Facchinetti, S. Fiorini, C. Erdinger, F.
Copyright Year	2010
Description	Author affiliation: Dipartimento di Elettronica e Informazione, Politecnico di Milano, 20133 Milan, Italy (Bombelli, L.; Facchinetti, S.; Fiorini, C.) \|\| Max-Planck Institut fuer extraterrestrische Physik, Giessenbachstrasse, 85748 Garching, Germany (De Vita, G.; Porro, M.; Herrmann, S.) \|\| Institute for Computer Engineering, University of Heidelberg, B6, 26, 68131, Mannheim, Germany (Erdinger, F.) \|\| Max-Planck Institut fuer Physik, Föhringer Ring 6, 80805 Munich, Germany (Wassatsch, A.)
Abstract	We present an integrated analog front-end for the readout of a non-linear DEPFET Sensor with Signal Compression (DSSC). The DSSC system, currently under development, is a 1-Mega pixel detector system for the European X-ray Free Electron Laser (XFEL) in Hamburg. It will record X-ray images with a maximum frame rate of 4.5MHz and will achieve at the same time a single photon resolution at 1keV and a high dynamic range. Two different readout strategies of the DEPFET pixel, Source Follower (SF) and Drain Readout (DR), have been fabricated in the 1.2V 0.13μm IBM CMOS technology. Both solutions share the same analog filter based on a new architecture that implements a trapezoidal shaping function employing only one operational amplifier. In this paper, the architecture of the analog front-end relative to both the readout strategies and of the new designed filter and the performance of the test chips are presented.
Starting Page	139
Ending Page	144
File Size	1100977
Page Count	6
File Format	PDF
ISBN	9781424491063
ISSN	10957863
e-ISBN	9781424491056
DOI	10.1109/NSSMIC.2010.5873733
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-10-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Semiconductor device measurement Current measurement Noise Pixel Dynamic range Logic gates Photonics
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

A new readout method based on source-current readout for DEPFET-based imagers

CALORIC: A Readout Chip for High Granularity Calorimeter

Curo- a current based readout asic for a depfet pixel based vertex detector at the ilc.

Development of the DEPFET sensor with signal compression: A large format X-ray imager with mega-frame readout capability for the European XFEL

CALORIC: A readout chip for high granularity calorimeter

Tests of a readout front-end electronics for a pixel detector based on inverter amplifier

Comparative analysis of 350nm CMOS Active Pixel Sensor electronics

P o S(TIPP2014)181 Recent Status of Front-end Electronics of DEPFET Pixel Detectors for Belle II Experiment (2014)

A low noise high dynamic range analog front-end ASIC for the AGIPD XFEL detector

A 5MHz low-noise 130nm CMOS analog front-end electronics for the readout of non-linear DEPFET sensor with signal compression for the European XFEL

Similar Documents

A new readout method based on source-current readout for DEPFET-based imagers

CALORIC: A Readout Chip for High Granularity Calorimeter

Curo- a current based readout asic for a depfet pixel based vertex detector at the ilc.

Development of the DEPFET sensor with signal compression: A large format X-ray imager with mega-frame readout capability for the European XFEL

CALORIC: A readout chip for high granularity calorimeter

Tests of a readout front-end electronics for a pixel detector based on inverter amplifier

Comparative analysis of 350nm CMOS Active Pixel Sensor electronics

P o S(TIPP2014)181 Recent Status of Front-end Electronics of DEPFET Pixel Detectors for Belle II Experiment (2014)

A low noise high dynamic range analog front-end ASIC for the AGIPD XFEL detector

A 5MHz low-noise 130nm CMOS analog front-end electronics for the readout of non-linear DEPFET sensor with signal compression for the European XFEL