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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Arora, V.K. Manaf bin Hashim, A. Chek, D. Saxena, T. |
| Copyright Year | 2009 |
| Description | Author affiliation: Faculty of Electrical Engineering, Universiti Teknologi Malaysia, UTM Skudai, Johor 81310, Malaysia (Manaf bin Hashim, A.; Chek, D.) || Department of Physics, Indian Institute of Technology, Bombay, Mumbai, India (Saxena, T.) || Division of Engineering and Physics, Wilkes University, Wilkes-Barre, PA18707, U. S. A. (Arora, V.K.) |
| Abstract | The transient effects in a nano/micro-scale channel are severely affected by the resistance blowup due to sublinear current-voltage characteristics leading to velocity and current saturation. This resistance blow-up effect increases the transit-time delay through the device that decreases as length of the conducting channel is decreased, but always larger than that predicted from the application of Ohm's law. RC time constant is shown to enhance dramatically while RL time constant decreases considerably over and above the predictions of Ohm's law. It is argued that the use of copper in place of aluminum for an interconnect and low-k dielectric for the parasitic capacitance may not necessarily lower the timing delay as intrinsic resistance rise is always present making optimization crucial. Also, the frequency response f = 1/ 2πτ will be affected as resistance blows up in a micro/nano-scale resistor. A higher capacitance extracted from RC time constants obtained from cutoff frequency is noted if R = R (Ohmic) in place of blown-up resistance R is used. |
| Starting Page | 1 |
| Ending Page | 2 |
| File Size | 77851 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781424460304 |
| DOI | 10.1109/ISDRS.2009.5378044 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-12-09 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electric breakdown Delay effects Resistors Voltage Virtual colonoscopy Timing Educational institutions Physics Electric resistance Parasitic capacitance |
| Content Type | Text |
| Resource Type | Article |
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