NDLI: Effects of mixing low-Z gases on a 2.45-GHz multiply charged ion source

Content Provider	IEEE Xplore Digital Library
Author	Kato, Y. Saitoh, M. Kubo, Y. Ishii, S.
Copyright Year	1996
Description	Author affiliation: Dept. of Electron. & Inf., Toyama Univ., Japan (Kato, Y.)
Abstract	Fundamental phenomena in mixing low-Z gases into the operating gas have been experimentally studied in an electron cyclotron resonance (ECR) multicharged ion source (2.45 GHz). The ECR plasma is confined in the mirror held superimposed by the octupole magnetic field. An ECR zone is formed near the bottom of the mirror trap. The main operating gas is argon. Hydrogen, helium, nitrogen, and oxygen gases are chosen as admixtures. The multicharged ions pass through the extractor at the mirror end, and the charge state distributions are investigated at various pressures and mixing ratios. The gas-mixing effect enhances production efficiency of high-charge state ions (Ar/sup 6+-9+/); in particular their currents substantially increase in the case of oxygen mixing. There exists an optimum mixing ratio and total pressure for each admixture. The electron temperature and density are measured by a Langmuir probe. The cause of enhanced production by admixing low-Z gases is discussed by taking account of plasma parameters including plasma potentials and ion temperatures estimated from elaborate measurement of the ion beam.
Starting Page	418
Ending Page	421
File Size	372683
Page Count	4
File Format	PDF
ISBN	078033289X
DOI	10.1109/IIT.1996.586382
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-06-16
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Gases Plasma temperature Plasma measurements Mirrors Electrons Plasma confinement Argon Production Plasma density Cyclotrons
Content Type	Text
Resource Type	Article

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