NDLI: Impact of the ionization profile on the time- and position-resolution in Multi-Linear Silicon Drift Detectors

Content Provider	IEEE Xplore Digital Library
Author	Castoldi, A. Chang, L. Guazzoni, C. Mezza, D. Carraresi, L. Hartmann, R. Struder, L.
Copyright Year	2013
Description	Author affiliation: Dip. Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy (Castoldi, A.; Chang, L.; Guazzoni, C.; Mezza, D.) \|\| Dipt. di Fis. e Astron., Univ. degli Studi di Firenze, Sesto Fiorentino, Italy (Carraresi, L.) \|\| PNSensor GmbH, Munich, Germany (Hartmann, R.; Struder, L.)
Abstract	Owing to the fully 3D topology of Multi-Linear Silicon Drift Detectors (MLSDD) and since the longitudinal coordinate is measured from the electron drift time, an accurate calibration of the relationship drift time vs. drift coordinate is needed and the dependence of the time-resolution and longitudinal position-resolution on the ionization profile has to be evaluated. In this work we performed a detailed qualification of the response mapping of one MLSDD prototype for different ionization profiles - namely 1 MeV, 3 MeV and 5 MeV protons and 705 nm and 904 nm IR laser. Probing the detector response with different ionization profiles allows performing a 3D mapping of the detector response. Moreover, thanks to the use of a custom deconvolution algorithm based on the conjugate gradient method, it is possible to extract the true shape of the current induced at the collecting anode from the preamplifier digitized output waveforms. The anode pulses provide detailed information on the transport properties of the detector allowing also to derive the effective longitudinal profile of the charge cloud that affects the position resolution measurements. Experimentally we measured a longitudinal broadening significantly larger (up to ~1.5x) than in the case of free broadening.
Starting Page	1
Ending Page	5
File Size	349219
Page Count	5
File Format	PDF
e-ISBN	9781479905348
DOI	10.1109/NSSMIC.2013.6829551
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-10-27
Publisher Place	South Korea
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Detectors Anodes Ionization Protons Silicon Semiconductor lasers Measurement by laser beam
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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