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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Luo Yin-Hong Guo Xiao-Qiang Guo Gang Fan Hui Hajdas, W. |
| Copyright Year | 2013 |
| Description | Author affiliation: China Inst. of Atomic Energy, Beijing, China (Guo Gang; Fan Hui) || Paul Scherrer Inst., Villigen, Switzerland (Luo Yin-Hong; Guo Xiao-Qiang; Hajdas, W.) |
| Abstract | The new generation ESA SEU Monitor was used in Beijing HI-13 Tandem accelerator after initial cross-calibration with the proton beams at Paul Scherrer Institu. Heavy ion cross sections obtained at HI-13 were very consistent with those from HIF and RADEF facilities. Beam homogeneity was also verified based on the SEU physical bitmap. In addition, the cross section dependence on ion energy near direct ionization threshold was preliminarily analyzed. An effects of die orientation on heavy ion SEU rate was first discovered. The die design layout may be responsible for this phenomenon. |
| Starting Page | 1 |
| Ending Page | 5 |
| File Size | 413807 |
| Page Count | 5 |
| File Format | |
| e-ISBN | 9781479905348 |
| DOI | 10.1109/NSSMIC.2013.6829636 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2013-10-27 |
| Publisher Place | South Korea |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Monitoring Single event upsets Testing Protons Random access memory Radiation effects charge sharing SEU Monitor the energy dependence die orientation SEU bitmap the design layout |
| Content Type | Text |
| Resource Type | Article |
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