NDLI: Numerical investigation of a non-interferometric grating-based X-ray imaging system

Content Provider	IEEE Xplore Digital Library
Author	Zhiqiang Chen Ran Zhang Li Zhang
Copyright Year	2013
Description	Author affiliation: Dept. of Eng. Phys., Tsinghua Univ., Beijing, China (Zhiqiang Chen; Ran Zhang; Li Zhang)
Abstract	Grating-based X-ray imaging can be classified into two categories: interferometric and non-interferometric. Interferometric setup, i.e. Talbot-Lau interferometer, has been intensively investigated in the recent past. To increase the angular sensitivity and maintain a reasonable system length, gratings with very small period are preferred, while the fabrication of such gratings remains challenging. Another obstacle for the interferometric setup is the degradation of visibility when using broadband X-ray sources, especially when operated at high Talbot orders. Non-interferometric setup uses a geometrical projection relation, thus has a more flexible system geometry. In this paper, we investigate the impact of several factors including grating period, intergrating distance and X-ray spectrum on the performance of the system using wave-optical simulations. In particular, we focus on the visibility of the phase stepping curve. Based on the simulation results, we discuss the design aspects and limitations of the non-interferometric setup.
Starting Page	1
Ending Page	3
File Size	227009
Page Count	3
File Format	PDF
e-ISBN	9781479905348
DOI	10.1109/NSSMIC.2013.6829160
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-10-27
Publisher Place	South Korea
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Gratings X-ray imaging Sensitivity Imaging Absorption Electron tubes Computational modeling
Content Type	Text
Resource Type	Article

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