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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Lam, J.K.S. Lee, S.W.R. |
| Copyright Year | 2008 |
| Description | Author affiliation: Electron. Packaging Lab., Hong Kong Univ. of Sci. & Technol., Hong Kong, China (Lam, J.K.S.; Lee, S.W.R.) |
| Abstract | In the present study, chemical dicing methods were developed as an alternative solution for thin silicon chips separation. Dicing streets were fabricated by wet and dry etching. The dry etching approach is reliable but also an expensive process. On the other hand, the wet etching approach offers a faster and low-cost process compared with the dry etching approach. However, serious undercutting usually occurs and damages the chip corners. During the course of the present study, a convex corner compensation scheme was implemented to resolve the undercutting problem. A parametric study was performed with various kinds of redundant [1 1 0]-oriented beam patterns at the corners of intersections. Experimental results showed that relatively sharp corners could be achieved with certain compensation patterns. A relation between the compensation pattern and the etched depth was established. The experimental result of the wet etching approach will be discussed in detail in this paper. |
| Starting Page | 161 |
| Ending Page | 166 |
| File Size | 5692480 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424421176 |
| DOI | 10.1109/EPTC.2008.4763428 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-12-09 |
| Publisher Place | Singapore |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Anisotropic magnetoresistance Wet etching Dry etching Blades Electronics packaging Chemical technology Chemical processes Parametric study Silicon compounds Laboratories |
| Content Type | Text |
| Resource Type | Article |
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