NDLI: A Post-Processing De-Embedding Technique and Effect of TRL Measurement Using an Incorrect Fixturing

Content Provider	IEEE Xplore Digital Library
Author	Lih-Tyng Hwang Shun-Meen Kuo
Copyright Year	2007
Description	Author affiliation: Motorola Labs., Schaumburg (Lih-Tyng Hwang)
Abstract	In conventional TRL (thru-reflection-line) de-embedding technique, a test fixturing, which mimics the traces (called adaptor) leading to a DUT (device under test), is fabricated. The TRL de-embedding procedure is performed on the test fixturing to obtain the calibration coefficients. Using the coefficients stored in the test instrument, the test instrument can thus report true characteristics (two-port s-parameter matrix, for example) of the DUT (Lucyszyn et al., 1992 and Pla et al.1995). The TRL de-embedding technique is accurate only when the test fixturing is identical to the adaptor of the DUT in both length and configuration. However, in some situations, such as a multi-I/O DUT (for example, a switch SP4T that has one input and 4 outputs) with only ONE set of TRL de-embedding fixturing, the accuracy of the DUT measurement could be inaccurate. For example, the coupling of the adaptor on the DUT test vehicle could be artificially added to or subtracted from the DUT, if the TRL de-embedding fixtures are not identical in both length and configuration to the adaptors connected to the DUT. The reported isolation characteristic of the DUT is thus inaccurate. In this article, a post processing de-embedding technique, which employs directly electrical property of the adaptor, is proposed. The postprocessing formulation was described and validated. The technique is then used to illustrate that the isolation of a DUT can be inaccurately reported if the TRL de-embedding fixturing is different from the adaptor of the DUT.
Starting Page	1884
Ending Page	1888
File Size	2920172
Page Count	5
File Format	PDF
ISBN	1424409845
ISSN	05695503
DOI	10.1109/ECTC.2007.374055
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-05-29
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fixtures Testing Switches Scattering parameters Calibration Vehicles Electric variables measurement Electric variables Connectors Performance evaluation
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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