NDLI: Wave-front aberration modeling based on wavelet methods

Content Provider	IEEE Xplore Digital Library
Author	Liu Tongshun Xie Wanqing Yang Lin Zhu Jin Ling Qiang
Copyright Year	2014
Description	Author affiliation: Dept. of Autom., Univ. of Sci. & Technol. of China, Hefei, China (Liu Tongshun; Yang Lin; Zhu Jin; Ling Qiang) \|\| Sch. of Inf. Sci. & Technol., Univ. of Sci. & Technol. of China, Hefei, China (Xie Wanqing)
Abstract	Wave-front aberration has serious adverse influence on the efficiency of optical system whose modeling problem is of great importance for further research. In this paper, wavelet method, which has a broad application in signal analysis, is used to model wave-front aberration. As the basis of wavelet method, the selection of basis function is the primary step for signal reconstruction, and two types of wave-front aberration are studied in this paper. First, for general wave-front aberration, a selection algorithm is given by comparing the minimum Mean Square Error (MSE).Secondly we take into account the primary wave-front aberration represented by finite Zernike polynomials, a simplified selection algorithm is proposed via minimum Maximum Mean Error Ratio (MMER) criterion. Numerical results shows that basis function selection algorithm via minimum MMER criterion can ensure the modeling accuracy, and it costs much smaller calculation than minimum MSE criterion.
Starting Page	7388
Ending Page	7392
File Size	114196
Page Count	5
File Format	PDF
ISBN	9789881563873
ISSN	19341768
DOI	10.1109/ChiCC.2014.6896227
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-07-28
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	TCCT, CAA
Subject Keyword	wavelet methods Accuracy wave-front aberration Noise basis function Polynomials Adaptive optics Mathematical model Multiresolution analysis
Content Type	Text
Resource Type	Article

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