NDLI: Aftershock effects on the reliability of electronic components under shock test

Content Provider	IEEE Xplore Digital Library
Author	Chen, Y.S. Yu-Chun Huang
Copyright Year	2009
Description	Author affiliation: Department of Mechanical Engineering, Yuan Ze University, 135 Yuan-tung Rd., Neili, Chung-li, Taoyuan, Taiwan 32026 (Chen, Y.S.; Yu-Chun Huang)
Abstract	Shock test is one of the significant reliability tests for electronics products. JEDEC test standards regulate only the first controlled-pulse by defining a variety of conditions such as the pulse peak acceleration, pulse duration and velocity change during the drop impact processes. In reality, a practical test showed that not only was one pulse produced, but also a series of two or more aftershocks are encountered. Hence, it is doubtful on whether and how the aftershocks influence results of components' reliability. The purpose of this study is to investigate the aftershocks' effect on the test products and to predict the time interval of its occurrence as well as the relating acceleration responses. The investigations include experimental, theoretical and finite element analysis methods. The severity of aftershock and the time instant it happens were first tested and modeled precisely. This model was then used as input both for theoretical and numerical calculations to solve system's response. Good consistencies among results of all three methods are observed, it is then possible to use the theoretical and FEA methods for the shock design of electronic systems prior to the manufacturing of the prototypes. Most importantly, the corresponding outcomes have taken the aftershock into consideration instead of only the primary pulse. It is believed to be more accurate in the reliability analysis of electronic products.
Starting Page	385
Ending Page	388
File Size	1544668
Page Count	4
File Format	PDF
ISBN	9781424443413
DOI	10.1109/IMPACT.2009.5382198
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-21
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Shock Aftershock Electric shock Electronic components Electronic equipment testing Finite Element (FE) Reliability Shock Response Spectrum (SRS)
Content Type	Text
Resource Type	Article

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