NDLI: Quantitative assessment of slit mura defect in thin film transistor-liquid crystal display based on chromaticity and optical density

Content Provider	IEEE Xplore Digital Library
Author	Fu-Ming Tzu Jung-Hua Chou
Copyright Year	2009
Description	Author affiliation: Department of Engineering Science, National Cheng Kung University, 1 University Road, Tainan, Taiwan 701 (Fu-Ming Tzu; Jung-Hua Chou)
Abstract	In this paper, we propose a creative non-contact automatic optical inspection (AOI) method for slit Mura measurements using a spectrometer and a photomultiplier tube (PMT). The experimental result indicate significant breakthrough of uniformity detection than typical macro CCD-based sensors and naked eyes, even the color difference is below the Just Noticeable Difference (JND) level. The characteristic of optical density (OD) is tended to be a concave curve; by contrast to chromaticity profile which shows a convex feature. Using the feature of chromaticity or optical density profiles across a slit Mura, the color difference from 0.12% to 2.71% in CIEy can be measured accurately. OD difference from 0.01 to 1.11 can be detected as well. Among of the samples, the most significant change is the 2.71% of CIEy chromatic variation versus a 1.1 OD difference along the slit Mura which is explored to quantity the JND's perceptibility. A higher chromaticity corresponds to a higher transmittance and a lower optical density, and can be deduced accurately by the present method.
Starting Page	373
Ending Page	376
File Size	5116315
Page Count	4
File Format	PDF
ISBN	9781424443413
DOI	10.1109/IMPACT.2009.5382196
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-10-21
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Photomultipliers Spectroscopy Eyes Density measurement Sensor phenomena and characterization Displays Thin film transistors Optical films Optical sensors Automatic optical inspection
Content Type	Text
Resource Type	Article

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