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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Shannon, S. Hebner, G. Holloway, J.P. Brake, M.L. |
| Copyright Year | 1998 |
| Description | Author affiliation: Dept. of Nucl. Eng. & Radiol. Sci., Michigan Univ., Ann Arbor, MI, USA (Shannon, S.) |
| Abstract | Summary form only given, as follows. A C/sub 2/F/sub 6/ discharge in a GEC rf reference cell equipped with an inductively coupled source has been analyzed using laser induced fluorescence and spatially resolved optical emission spectroscopy. Experiments were conducted approximately 1 cm above the lower electrode for C/sub 2/F/sub 6/ and C/sub 2/F/sub 6//Ar discharges at pressures ranging from 5 mTorr to 20 mTorr and inductive electrode power ranging from 100 W to 300 W. A 30 W bias was placed on the bottom electrode for all experiments. A 6 inch bare silicon wafer was used to represent processing conditions. A quartz ring was clamped to the top electrode to provide discharge stability. Radial profiles of optical emission were obtained using a novel glow discharge tomography sensor and regularized inversion solver. The 488 nm SiF line and the 703 nm F line were profiled, as well as the 750.4 nm Ar line in the C/sub 2/F/sub 6//Ar runs in order to conduct spatially resolved actinometry of fluorine. Spatially resolved ground state radical density profiles were measured by laser induced fluorescence. |
| File Size | 107922 |
| File Format | |
| ISBN | 0780347927 |
| ISSN | 07309244 |
| DOI | 10.1109/PLASMA.1998.677626 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1998-06-01 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electrodes Spatial resolution Optical sensors Argon Fluorescence Stimulated emission Fault location Optical coupling Spectroscopy Silicon |
| Content Type | Text |
| Resource Type | Article |
| Subject | Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering |
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