NDLI: An advanced electromagnetic eigenmode solver for vacuum electronics devices-CTLSS

Content Provider	IEEE Xplore Digital Library
Author	Cooke, S.J. Mondelli, A.A. Levush, B. Petillo, J.J. Nelson, E. Chernin, D.P. Antonsen Jr., T.M.
Copyright Year	1998
Description	Author affiliation: Inst. for Plasma Res., Maryland Univ., College Park, MD, USA (Cooke, S.J.)
Abstract	Summary form only given. The first module of the Cold-Test and Large-Signal Simulation (CTLSS) code, a next generation design tool for vacuum electronics devices, is presented. The prototype tool is a three-dimensional, finite-difference, frequency-domain cold-test code that operates on a rectangular structured grid. It uses a generalisation of the Jacobi-Davidson algorithm that has proven effective in solving test problems having sharp-edged structures with materials having large dielectric constants and loss tangents as high as 100%. Cold-test codes typically have experienced difficulty handling moderate to large loss tangents in sharp-edged structures (i.e., problems in which there is a large gradient in the loss tangent across the numerical grid.) this talk will present the CTLSS cold-test algorithm and code features that are useful for vacuum electronics design. Analysis of both closed cavities and periodic slow-wave structures will be presented. Initial tests on closed cavities indicate that the CTLSS algorithm can determine normal-mode frequencies well below 0.1% accuracy for all modes computed. During the coming year this code will be generalised to include unstructured, finite-element numerical mesh for the conformal representation of structures. The cold-test fields will feed forward into a large-signal simulation model, based on the CHRISTINE code (Antonsen et al., 1997).
File Size	114917
File Format	PDF
ISBN	0780347927
ISSN	07309244
DOI	10.1109/PLASMA.1998.677560
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-06-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Prototypes Finite difference methods Jacobian matrices Materials testing Dielectric materials Dielectric constant Dielectric losses Algorithm design and analysis Periodic structures Frequency
Content Type	Text
Resource Type	Article
Subject	Atomic and Molecular Physics, and Optics Condensed Matter Physics Electrical and Electronic Engineering

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