NDLI: Analysis and simulation of manufactured screen-printed solar cells

Content Provider	IEEE Xplore Digital Library
Author	Wenham, S.R. Bruce, A.
Copyright Year	2005
Description	Author affiliation: New South Wales Univ., Sydney, NSW, Australia (Wenham, S.R.; Bruce, A.)
Abstract	A detailed study has been conducted of the performance of millions of screen-printed solar cells to analyse the various processing parameters and their interdependencies. Algorithms have been developed to quite accurately predict device structure and hence performance as a function of the many manufacturing processing parameters. The processes characterized include the saw-damage removal etch, anisotropic texturing, emitter diffusion, edge junction isolation, AR coating deposition and the screen-printing and firing of the front and rear metal contacts. From the developed algorithms, a simulator has been developed which includes the natural variations in device parameters that occur in a real production environment due to relatively random effects such as thermal gradients within furnaces, slight fluctuations in belt speeds, gas flows, plasma etching power, chemical concentrations, furnace temperature controllers, wafer quality, etc. These can have a significant effect on electrical yields. Even common factors affecting the mechanical yields in production have been programmed into the simulator. Since the virtual production line was primarily developed for the purposes of educating and training engineers, extensive in-line quality control testing has also been incorporated, such as the measurement of: minority carrier lifetimes; substrate resistivity; emitter sheet resistivity; wafer thickness; screen-printing paste thickness and width; AR coating thickness and refractive index; surface reflection; spectral response; I-V characteristics; series resistance; shunt resistance; ideality factor; doping profile; etc.
Sponsorship	IEEE Electron Devices Soc. (USA)
Starting Page	1659
Ending Page	1662
File Size	1087194
Page Count	4
File Format	PDF
ISBN	0780387074
ISSN	01608371
DOI	10.1109/PVSC.2005.1488465
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-01-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Analytical models Virtual manufacturing Photovoltaic cells Production Surface resistance Etching Coatings Plasma simulation Furnaces Plasma temperature
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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