NDLI: Statistical process control driven variation reduction critical to manufacturing success

Content Provider	IEEE Xplore Digital Library
Author	Fredric, C. Crabtree, G. Holderman, K. Mandrell, L. Nickerson, J. Jester, T.
Copyright Year	2005
Description	Author affiliation: Shell Solar Ind., USA (Fredric, C.; Crabtree, G.; Holderman, K.; Mandrell, L.; Nickerson, J.; Jester, T.)
Abstract	The manufacture of state of the art production solar cells introduces sources of variation that are both omnipresent and potentially devastating to the product quality as measured by solar cell performance variation. Towards minimizing these sources of variation, Shell Solar has chosen an approach that considers all reasonable sources of variation as potential parameters for formal statistical process control (SPC). The milestones for improvement of a given parameter are: 1) establish SPC, 2) demonstrate statistical control and 3) demonstrate statistical capability. The strategy chosen for variation reduction at Shell Solar is a particular application of statistical process control. SPC is the application of statistical methods to measurement and analysis of process variation. It applies to both in-process parameters (e.g. firing time at peak temperature) and product parameters (e.g. Voc). There are those who use the term SPC for techniques that do not involve the use of statistics. We believe that statistical treatment of the data is necessary for effective SPC. Through the use of specific examples within the Shell Solar cell processing line we will demonstrate the use of SPC, the reduction of cell variation, and the ultimate improvement of both variation and cell performance made possible using these techniques.
Sponsorship	IEEE Electron Devices Soc. (USA)
Starting Page	939
Ending Page	942
File Size	710381
Page Count	4
File Format	PDF
ISBN	0780387074
ISSN	01608371
DOI	10.1109/PVSC.2005.1488286
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-01-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Process control Manufacturing processes Boron Coatings Photovoltaic cells Current measurement Voltage measurement Etching Manufacturing industries Production
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in