NDLI: Recombination lifetime and trap density variations in multicrystalline silicon wafers through the block

Content Provider	IEEE Xplore Digital Library
Author	Bentzen, A. Tathgar, H. Kopecek, R. Sinton, R. Holt, A.
Copyright Year	2005
Description	Author affiliation: Sect. for Renewable Energy, Inst. for Energy Technol., Kjeller, Norway (Bentzen, A.)
Abstract	We have studied the variations in recombination lifetime and density of non-recombinative traps between wafers through the entire height of a multicrystalline silicon block. We find that the low lifetime regions in the very bottom and top part of an ingot are described by a relatively high density of non-recombinative traps. It is argued that in the bottom region in-diffused impurities from the crucible, as well as grain boundaries and dislocations, could be the major trap contributors. In the upper region, trapping is believed to be due to high concentrations of metallic impurities, caused by segregation during growth and solid-state diffusion during cooling of the ingot. Moreover, we have investigated the gettering response of wafers from different positions within the block from a 50/spl Omega//sq phosphorus emitter diffusion. The results show that the most notable lifetime enhancements occur in regions of the block where the trap density is high, indicating the relevance of mobile impurities as non-recombinative trapping centers.
Sponsorship	IEEE Electron Devices Soc. (USA)
Starting Page	1074
Ending Page	1077
File Size	861086
Page Count	4
File Format	PDF
ISBN	0780387074
ISSN	01608371
DOI	10.1109/PVSC.2005.1488320
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-01-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Silicon Impurities Conducting materials Production Renewable energy resources Gettering Thermal stresses Furnaces Crystalline materials Material properties
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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