NDLI: Consistent processing and long term stability of CdTe devices

Content Provider	IEEE Xplore Digital Library
Author	Barth, K.L. Enzenroth, R.A. Sampath, W.S.
Copyright Year	2005
Description	Author affiliation: Mater. Eng. Laboratory, Colorado State Univ., Fort Collins, CO, USA (Barth, K.L.; Enzenroth, R.A.; Sampath, W.S.)
Abstract	A technology for processing of thin film CdS/CdTe devices has been developed in our laboratory. This in-line, continuous, pilot system enables unique processing steps and conditions not available with batch processing and allows the fabrication of a large number of devices. Results from the pilot scale system are applicable to systems processing larger areas. Utilizing the pilot system, significant progress has been made towards demonstrating consistent stability (resistance to degradation) for thin film CdTe photovoltaics. We have repeatedly shown that devices with good stability can be produced if processed at the optimum set of conditions. Small changes in processes can lead to significant differences in device stability. Among the processing steps for fabrication of CdTe devices, the CdCl/sub 2/ treatment has a significant effect on performance and stability. A metric has been developed to predict the stability of devices at the time of device fabrication. Accelerated stress testing is ongoing. Extremely long duration stress testing (65/spl deg/C, open circuit conditions for /spl sim/30,000 hours with 5 hours of illumination out of 8 hour cycle) has demonstrated that the rate of efficiency loss levels out with final efficiencies in the range of 8.5% /spl sim/ 9.5%. A production prototype system for processing nominally 2 MW/yr. is currently under construction. This system utilizes the process definition developed in the pilot system.
Sponsorship	IEEE Electron Devices Soc. (USA)
Starting Page	323
Ending Page	326
File Size	742521
Page Count	4
File Format	PDF
ISBN	0780387074
ISSN	01608371
DOI	10.1109/PVSC.2005.1488134
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-01-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fabrication Circuit testing Circuit stability Stress Thin film devices Laboratories Degradation Transistors Photovoltaic cells Life estimation
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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