NDLI: AFM-based microelectrical characterization of grain boundaries in Cu(In,Ga)Se/sub 2/ thin films

Content Provider	IEEE Xplore Digital Library
Author	Jiang, C.-S. Noufi, R. Ramanathan, K. AbuShama, J.A. Moutinho, H.R. Al-Jassim, M.M.
Copyright Year	2005
Description	Author affiliation: Nat. Renewable Energy Lab., Golden, CO, USA (Jiang, C.-S.; Noufi, R.; Ramanathan, K.; AbuShama, J.A.; Moutinho, H.R.; Al-Jassim, M.M.)
Abstract	We report on a direct measurement of two-dimensional potential distribution on the surface of Cu(In,Ga)Se/sub 2/ thin films using a nanoscale electrical characterization of scanning Kelvin probe microscopy both in air and in ultra-high vacuum. The potential measurement reveals a higher surface potential or a smaller work function on grain boundaries (GBs) of the film than on the grain surfaces. This demonstrates the existence of a local built-in potential on GBs, and the GB is positively charged. The role of the built-in potential in device performance was further examined and found to be positive, by tuning Ga content or band gap of the film. With increasing Ga content, the potential drops sharply in a Ga range of 28%/spl sim/38%. Comparing the change in the built-in potential to the theoretical and experimental photoconversion efficiencies, we conclude that the potential plays a significant role in the device conversion efficiency of NREL's three-stage Cu(In,Ga)Se/sub 2/ device.
Sponsorship	IEEE Electron Devices Soc. (USA)
Starting Page	251
Ending Page	254
File Size	798485
Page Count	4
File Format	PDF
ISBN	0780387074
ISSN	01608371
DOI	10.1109/PVSC.2005.1488116
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2005-01-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Grain boundaries Transistors Atomic force microscopy Interface states Kelvin Probes Resonance Resonant frequency Renewable energy resources Laboratories
Content Type	Text
Resource Type	Article
Subject	Industrial and Manufacturing Engineering Control and Systems Engineering Electrical and Electronic Engineering

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