NDLI: Experiment-based scatter correction for cone-beam computed tomography using the statistical method

Content Provider	IEEE Xplore Digital Library
Author	Aootaphao, S. Thongvigitmanee, S.S. Rajruangrabin, J. Junhunee, P. Thajchayapong, P.
Copyright Year	2013
Description	Author affiliation: Image Technol. Lab., Nat. Electron. & Comput. Technol. Center, Thailand (Aootaphao, S.; Thongvigitmanee, S.S.; Rajruangrabin, J.) \|\| Nat. Sci. & Technol. Dev. Agency, Pathumthani, Thailand (Thajchayapong, P.) \|\| Med. Devices Lab., Nat. Metal & Mater. Technol. Center, Thailand (Junhunee, P.)
Abstract	Scatter signals in cone-beam computed tomography (CBCT) cause a significant problem that degrades image quality of reconstructed images, such as inaccuracy of CT numbers and cupping artifacts. In this paper, we will present an experiment-based scatter correction method by pre-processing projection images using a statistical model combined with experimental kernels. The convolution kernels are estimated by using different thickness of PMMA plates attached to a beam stop lead sheet such that the scatter signal values can be measure in the shadow area of the projection images caused by the lead sheet. The scatter signal values of different thickness levels can be measured in the shadow area of projection images caused by the lead sheet. Then, the projection images are convolved with the kernels that are derived from the actual measurement of scatter signals in PMMA plates. Finally, the primary signals can be estimated using the maximum likelihood expectation maximization method. Experimental results by using the proposed method show that the quality of the reconstruction images is significantly improved. The CT numbers become more accurate and the cupping artifact is reduced.
Starting Page	5087
Ending Page	5090
File Size	480798
Page Count	4
File Format	PDF
ISBN	9781457702167
ISSN	1557170X
DOI	10.1109/EMBC.2013.6610692
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-07-03
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Kernel Computed tomography Image reconstruction Noise Thickness measurement Detectors X-ray imaging
Content Type	Text
Resource Type	Article
Subject	Signal Processing Biomedical Engineering Health Informatics Computer Vision and Pattern Recognition

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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