NDLI: Open resonator mode patterns for characterization of anisotropic dielectric substrates for HTS thin films

Content Provider	IEEE Xplore Digital Library
Author	Harrington, T.E. Wosik, J. Long, S.A.
Copyright Year	2002
Abstract	An open resonator possesses a unique combination of advantages for characterizing the millimeter-wave losses of today's best HTS thin films and substrates. One of the primary advantages is the transverse linearly-polarized electric field of the TEM/sub 00q/ modes, which induces a polarized current in any HTS, dielectric, or semiconductor sample placed inside the resonator. The polarized current flow allows detection and quantification of any material anisotropies. To provide an intuitive understanding of the field and current distributions in an open resonator, mode patterns computed with a finite-difference time-domain model are presented. The theory of open-resonator anisotropic-dielectric testing is reviewed, and measured anisotropic dielectric constants of sapphire, LaAlO/sub 3/, and NdGaO/sub 3/ substrates are listed.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	1861
Ending Page	1864
Page Count	4
File Size	809950
File Format	PDF
ISSN	10518223
Volume Number	7
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Anisotropic magnetoresistance Dielectric substrates High temperature superconductors Dielectric thin films Polarization Semiconductor thin films Dielectric materials Semiconductor materials Current distribution Distributed computing
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

HTS hairpin microstrip filter on r-cut sapphire substrate

Relationship between surface resistance and critical current density of HTS thin films in a DC magnetic field

Measurements of millimeter-wave surface resistance and temperature dependence of reactance of thin HTS films using quasi-optical dielectric resonator

Thin-film HTS probe coils for magnetic-resonance imaging

Sensitivity of R/sub s/-measurement of HTS thin films by three prime resonant techniques: cavity resonator, dielectric resonator, and microstrip resonator

Dependence of surface resistance in HTS thin films on a DC magnetic field

Surface resistance measurements of HTS thin films using SLAO dielectric resonator

Anisotropic Jc-/spl thetav/ measurements at low fields on a-MoSi thin films: evidence of a two-dimensional regime

Improvement of Q of artificial dielectric resonator in waveguide

Open resonator mode patterns for characterization of anisotropic dielectric substrates for HTS thin films

Similar Documents

HTS hairpin microstrip filter on r-cut sapphire substrate

Relationship between surface resistance and critical current density of HTS thin films in a DC magnetic field

Measurements of millimeter-wave surface resistance and temperature dependence of reactance of thin HTS films using quasi-optical dielectric resonator

Thin-film HTS probe coils for magnetic-resonance imaging

Sensitivity of R/sub s/-measurement of HTS thin films by three prime resonant techniques: cavity resonator, dielectric resonator, and microstrip resonator

Dependence of surface resistance in HTS thin films on a DC magnetic field

Surface resistance measurements of HTS thin films using SLAO dielectric resonator

Anisotropic Jc-/spl thetav/ measurements at low fields on a-MoSi thin films: evidence of a two-dimensional regime

Improvement of Q of artificial dielectric resonator in waveguide

Open resonator mode patterns for characterization of anisotropic dielectric substrates for HTS thin films