NDLI: Characterization of ramp edge-geometry Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x//PrBa/sub 2/Cu/sub 3/O/sub 7-x//Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x/ junctions and dc SQUIDs

Content Provider	IEEE Xplore Digital Library
Author	Jia, Q.X. Reagor, D. Wu, X.D. Mombourquette, C. Foltyn, S.R.
Copyright Year	2002
Abstract	High-temperature superconducting Josephson junctions and dc SQUIDs were fabricated using a ramp edge-geometry SNS configuration. Ag-doped YBa/sub 2/Cu/sub 3/O/sub 7-x/ was used as electrodes and PrBa/sub 2/Cu/sub 3/O/sub 7-x/ as barrier. The I/sub c/R/sub n/ value of the junctions was in excess of 120 /spl mu/V at 75 K. The dc SQUIDs showed a flux modulation depth, /spl part/V//spl part//spl Phi/, over 150 /spl mu/V//spl Phi/, at 75 K. The flux noise of the devices, measured with dc bias currents operated at 75 K, showed a 1/f dependence at low frequency having values below 100 /spl mu//spl Phi//sub 0/Hz/sup - 1/2 / (the best values in the range of 30/spl sim/40 /spl mu//spl Phi//sub 0/Hz/sup - 1/2 /) at 1 Hz and less than 5 /spl mu//spl Phi//sub 0/Hz/sup - 1/2 / in the white noise region. The voltage modulation and magnetic field noise were 37 /spl mu/V and /spl sim/2 pTHz/sup - 1/2 / at 1 kHz for the directly-coupled dc SQUID magnetometers (with a pick-up loop 6 mm/spl times/ 3.5 mm) based on the ramp edge-geometry SNS configuration.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3005
Ending Page	3008
Page Count	4
File Size	526953
File Format	PDF
ISSN	10518223
Volume Number	7
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Josephson junctions SQUIDs Superconducting device noise High temperature superconductors Superconducting devices Electrodes Low-frequency noise Acoustical engineering Current measurement Frequency measurement
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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DC-SQUIDs of YBa/sub 2/Cu/sub 3/O/sub 7/ with artificial PrBa/sub 2/Cu/sub 3/O/sub x/ barriers

Application of Josephson edge type junctions with a PrBa/sub 2/Cu/sub 3/O/sub 7/ barrier prepared with Br-ethanol etching or cleaning

Electrical and noise properties of YBa/sub 2/Cu/sub 3/O/sub 7/ ramp-type Josephson junctions

Development of Integrated HTS SQUIDs With a Multilayer Structure and Ramp-Edge Josephson Junctions

Transport processes and reduction of I/sub c/R/sub n/ product in YBa/sub 2/Cu/sub 3/O/sub x//PrBa/sub 2/Cu/sub 3/O/sub x//YBa/sub 2/Cu/sub 3/O/sub x/ ramp-type Josephson junctions

Proximity effect in edge type junctions with PrBa/sub 2/Cu/sub 3/O/sub 7/ barriers prepared by Br-ethanol etching

Heteroepitaxial YBa/sub 2/Cu/sub 3/O/sub 7-x/-PrBa/sub 2/Cu/sub 3/O/sub 7-x/-YBa/sub 2/Cu/sub 3/O/sub 7-x/ weak links grown by laser deposition

Current phase relation of Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7/(-/spl delta/) step edge junction

The observation of the AC Josephson effect in a YBa/sub 2/Cu/sub 3/O/sub 7//Au/YBa/sub 2/Cu/sub 3/O/sub 7/ junction

Characterization of ramp edge-geometry Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x//PrBa/sub 2/Cu/sub 3/O/sub 7-x//Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x/ junctions and dc SQUIDs

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Application of Josephson edge type junctions with a PrBa/sub 2/Cu/sub 3/O/sub 7/ barrier prepared with Br-ethanol etching or cleaning

Electrical and noise properties of YBa/sub 2/Cu/sub 3/O/sub 7/ ramp-type Josephson junctions

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Characterization of ramp edge-geometry Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x//PrBa/sub 2/Cu/sub 3/O/sub 7-x//Ag:YBa/sub 2/Cu/sub 3/O/sub 7-x/ junctions and dc SQUIDs