NDLI: Properties of HTS step-edge SNS junctions

Content Provider	IEEE Xplore Digital Library
Author	Golubov, A.A. Krasnov, V.M. Kupriyanov, M.Yu.
Copyright Year	2002
Abstract	The critical current and current-voltage characteristics of step-edge HTS SNS junctions are discussed theoretically. In accordance with the experimental data it is assumed that the current transport through both NS interfaces takes place in ab-direction. In the bottom interface ((001) surface of YBCO) the ab-coupling may occur due to atomic steps which play a role of constrictions for the current flow. Therefore the contact is modelled as SNS structure with system of constrictions located at both interfaces. The I_cR_N product and the excess current I_ex are calculated as a function of temperature, interface transparency and N layer thickness. It is shown that in accordance with the experimental data the I_ex and I_c are of the same order of magnitude in a broad parameter range.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3204
Ending Page	3207
Page Count	4
File Size	431506
File Format	PDF
ISSN	10518223
Volume Number	7
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	High temperature superconductors Yttrium barium copper oxide Gold Electrodes Solid state circuits Superconducting films Transistors Nuclear physics Critical current Atomic layer deposition
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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