NDLI: Josephson flux-flow resonances and transistors based on YBa/sub 2/Cu/sub 3/O/sub 7/ step edge junctions

Content Provider	IEEE Xplore Digital Library
Author	Yi, H.R. Winkler, D. Claeson, T.
Copyright Year	2002
Abstract	The flexibility of step edge junctions is very attractive for device applications. With an improved process based on an amorphous carbon mask technique and electron beam lithography, we were able to fabricate high quality YBa₂Cu₃0₇ long Josephson junctions across sharp and straight step edges on (001) LaAl0₃ substrates. Flux-flow resonances were observed in the current-voltage curves for some long Josephson junctions. The resonance voltage can linearly be tuned by an applied magnetic field. Asymmetric in-line type Josephson flux-flow transistors were fabricated based on the long Josephson junctions. The critical current I_c, and the response voltage V at a fixed bias current I_b, were measured as a function of the control current I through a control line inductively coupled to the junction. A maximum current gain of g=17, and a corresponding transresistance of r_m=9 Ω, were achieved at 4.2 K.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2623
Ending Page	2626
Page Count	4
File Size	489884
File Format	PDF
ISSN	10518223
Volume Number	7
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Yttrium barium copper oxide Josephson junctions Amorphous materials Lithography Substrates Temperature Magnetic resonance Magnetic field measurement Voltage control SQUIDs
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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