NDLI: Josephson properties of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub y/ bicrystal junctions grown by a sequential deposition technique using molecular beam epitaxy

Content Provider	IEEE Xplore Digital Library
Author	Kiejin Lee Iguchi, I. Ishibashi, T. Sato, K. Soutome, H. Kawabe, M.
Copyright Year	2002
Abstract	We report Josephson and crystallographic properties of the Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub y/ junctions fabricated on MgO(100) bicrystal substrates by a molecular-beam-epitaxy method incorporating co-evaporation and sequential deposition techniques. With the sequential deposition technique which has the advantage of promoting the surface diffusion of adatoms, we obtained the highly growth-controlled films without precipitation of any second impurity phases. During the film growth, the sharp reflection high-energy electron diffraction (RHEED) patterns were also observed. However, the RHEED patterns showed the a-b twin structures due to the lattice mismatch, which influenced the Josephson transport properties at the junction boundary. The normal resistance of the bicrystal junction was 1.5 /spl Omega/ and the I/sub c/R/sub n/ product was 0.75 mV at 4.2 K. The Shapiro steps under millimeter-wave irradiation were clearly observed up to 65 K. The Josephson microwave self-radiation spectra at receiving frequency f/sub REC/=22 GHz. The observed Josephson transport properties are discussed in relation to the microscopic crystallographic properties.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	2300
Ending Page	2303
Page Count	4
File Size	539997
File Format	PDF
ISSN	10518223
Volume Number	7
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Crystallography Optical films Bismuth Strontium Substrates Impurities Reflection Electrons Diffraction Lattices
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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Comparison of intrinsic Josephson and SIS tunneling spectroscopy of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta//

Temperature dependence of the Josephson critical current in Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+x/ break junctions

Josephson properties of Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub y/ bicrystal junctions grown by a sequential deposition technique using molecular beam epitaxy

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