NDLI: The effect of the maximum processing temperature on the microstructure and electrical properties of melt processed Ag-sheathed Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub x/ tape

Content Provider	IEEE Xplore Digital Library
Author	Polak, M. Zhang, W. Polyanskii, A. Pashitski, A. Hellstrom, E.E. Larbalestier, D.C.
Copyright Year	2002
Abstract	The critical current density (J/sub c/) is very sensitive to the maximum temperature (T/sub m/) used to melt process Ag-sheathed Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub x/ tapes. In this study we have found that the optimum T/sub m/ was 894-896/spl deg/C and that variations of /spl plusmn/2/spl deg/C strongly decreased J/sub c/. We found that the density of the oxide core and its Vickers hardness displayed a maximum in tapes that had been processed at the optimum T/sub m/. In addition, the room temperature electrical resistivity of the core was lowest for the tapes with the maximum J/sub c/ at 4.2 K. A formation of macropores was observed in tapes processed at T/sub m/ above the optimum one. MO imaging and SEM observation showed that the magnetic flux penetrates more easily into tape areas containing macropores. Together these observations show that T/sub m/ exerts a very powerful effect on the macroscopic density of the oxide core, this controlling the connectivity and the effective cross-section of the oxide core. Thus J/sub c/ depends on T/sub m/ primarily because the effective cross-section of the core depends on T/sub m/.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	1537
Ending Page	1540
Page Count	4
File Size	873485
File Format	PDF
ISSN	10518223
Volume Number	7
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microstructure Magnetic cores Melt processing Critical current density Temperature dependence Bismuth compounds Powders Critical current Temperature distribution Furnaces
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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