NDLI: Scanning microwave microscopy of active superconducting microwave devices

Content Provider	IEEE Xplore Digital Library
Author	Anlage, S.M. Vlahacos, C.P. Dutta, S. Wellstood, F.C.
Copyright Year	2002
Abstract	We have developed a scanning microwave microscope which can image features with 20 /spl mu/m spatial resolution. The microscope consists of a section of open-ended coaxial cable which is scanned over the surface of a planar sample. Images can be made in either passive mode, in which the reflectivity of the probe tip is measured as a function of position, or in active mode, in which stray fields from the sample are picked up by the scanning probe and measured with a vector demodulation circuit. We have imaged reflectivity variations of metallic and superconducting samples in passive mode to determine the spatial resolution of the technique. Images are also presented in active mode of a superconducting microwave device taken at liquid nitrogen temperature.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	3686
Ending Page	3689
Page Count	4
File Size	1209892
File Format	PDF
ISSN	10518223
Volume Number	7
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Microscopy Superconducting microwave devices Spatial resolution Reflectivity Probes Position measurement Superconducting cables Coaxial cables Demodulation Circuits
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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