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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Pan, A.V. Ionescu, M.H. Dou, S.X. |
| Copyright Year | 2002 |
| Abstract | Critical current density (J/sub c/) spatial distribution in the superconducting core of the Ag-sheathed Bi-2212 tapes prepared by "powder in tube" technique has been measured by means of tape cutting along the rolling direction to a few narrow strips and separate J/sub c/ measurements each of them. The J/sub c/ value on the edges of tapes has been found to be higher by a factor of about 3 in comparison with the central area. Unexpectedly, the measured oxide core density is shown to be in contrary the lowest in the edge regions. The thin interface layer (about 10 /spl mu/m thick) with no secondary phase has been observed by SEM on the whole circumference of Ag-sheath/core boundary. This interface layer is assumed to be responsible for the dominant contribution to the supercurrent-carrying ability of a tape. However, in fact the J/sub c/-values on the very edge of the core still are twice as high as J/sub c/ in the central region (3.6/spl times/10/sup 4/ against 1.8/spl times/10/sup 4/ A/cm/sup 2/). Thus, an optimal structure formation can be promoted by the core edge geometry. |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 1331 |
| Ending Page | 1334 |
| Page Count | 4 |
| File Size | 595025 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 7 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1997-06-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Superconducting films Microstructure Strips Silver Powders Superconducting epitaxial layers Impurities Hydrodynamics Heat treatment Critical current density |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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