NDLI: Ultrasonic scattering from complex crack morphology features

Content Provider	IEEE Xplore Digital Library
Author	Blackshire, J.L.
Copyright Year	2012
Description	Author affiliation: Air Force Res. Lab. (AFRL/RXCA), Wright-Patterson AFB, OH, USA (Blackshire, J.L.)
Abstract	In a typical ultrasound measurement, only the scattering cross-section features are considered involving the overall crack profile. A realistic crack, however, can have local curvature and sharpness features, which can have an effect on the ultrasonic scattering response and detected signal content. A study of crack morphology effects on ultrasonic scattering in the near- and far-field is described. Finite element models, scanning laser vibrometry, and optical microscopy measurements are used to study ultrasound scattering from realistic cracks in superalloy materials, where three primary length scale effects are considered - 1) overall crack profile, 2) local variations in crack profile, and 3) local roughness features. Ultrasonic frequency/wavelength and crack length scale features are considered for both near-field and far-field regions, where direct comparisons of model predictions and experimental measurements are made. Local crack roughness features produced very localized and complex wave scattering effects in the extreme near-field of the crack site, while crack profile variations on the order of, or larger than, the ultrasonic wavelength produced coherent scattered field patterns that diverged, were directional in nature, and extended well into the far-field.
Starting Page	248
Ending Page	251
File Size	1171873
Page Count	4
File Format	PDF
ISBN	9781467345613
ISSN	19485719
e-ISBN	9781467345620
DOI	10.1109/ULTSYM.2012.0061
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2012-10-07
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Morphology Scattering Acoustics Reflection Surface cracks Surface morphology Ultrasonic imaging Reliable Crack Sizing Ultrasound Scattering Crack Morphology
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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