NDLI: Cantilever dynamics and energy localization during atomic force microscope infrared spectroscopy

Content Provider	IEEE Xplore Digital Library
Author	Cho, H. Felts, J.R. Yu, M.-F. Bergman, L.A. Vakakis, A.F. King, W.P.
Copyright Year	2013
Description	Author affiliation: Dept. of Mech. Sci. & Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA (Cho, H.; Felts, J.R.; Vakakis, A.F.; King, W.P.) \|\| Dept. of Aerosp. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA (Bergman, L.A.) \|\| Sch. of Aerosp. Eng., Georgia Inst. of Technol., Atlanta, GA, USA (Yu, M.-F.)
Abstract	We report rapid nanometer-scale chemical identification of polymer films using atomic force microscope infrared spectroscopy (AFM-IR). AFM-IR enables chemical characterization and identification in an AFM, but requires a relatively long acquisition time for high resolution mapping due to its low signal to noise ratio (SNR). In AFM-IR, infrared laser light incident upon a sample results in photothermal expansion of the sample, which is measured by an AFM tip in contact with the sample. The resulting cantilever vibrations vary in both time and frequency. We analyze the cantilever dynamic response during AFM-IR using a wavelet transform technique, which reveals how the energy is localized in the cantilever response. Based on this analysis, we tailor a time-frequency-domain filter to identify the region of highest vibrational energy. This approach can increase the SNR of the AFM-IR signal, such that the throughput is increased by 32X compared to state of the art. We show how this SNR improvement can improve AFM-IR imaging speed and chemical identification of nanometer-scale domains in polymer films.
Starting Page	908
Ending Page	911
File Size	1783692
Page Count	4
File Format	PDF
ISBN	9781467359832
ISSN	21641641
DOI	10.1109/Transducers.2013.6626915
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-06-16
Publisher Place	Spain
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Signal to noise ratio Chemicals Spectroscopy Time-frequency analysis Microscopy Polymers Force cantilever dynamics Atomic force microscope infrared spectroscopy wavelet transform
Content Type	Text
Resource Type	Article

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