NDLI: Measurement of shear stress between single-wall carbon nanotubes and substrates using NEMS devices

Content Provider	IEEE Xplore Digital Library
Author	Pan, H.Y. Wu, Y.C. Ryan, P.J. Adams, G.G. McGruer, N.E.
Copyright Year	2011
Description	Author affiliation: Mechanical and Industrial Engineering, Northeastern University, Boston, Massachusetts, USA (Wu, Y.C.; Ryan, P.J.; Adams, G.G.) \|\| Electrical and Computer Engineering, Northeastern University, Boston, Massachusetts, USA (Pan, H.Y.; McGruer, N.E.)
Abstract	This paper presents a novel and easily controllable method for measurement of the interaction of single-wall carbon nanotubes (SWNTs) with surfaces using simple cantilever beams, a nanomanipulator, and a scanning electron microscope (SEM). A small SWNT bundle is assembled across two cantilevers by dielectrophoresis, with one cantilever much more flexible than the other. The flexible cantilever is then pushed away from the stiffer cantilever in order to produce slip between the SWNTs and the cantilever surface. When the cantilever returns to its initial position, axial slack is observed in the SWNTs. A theoretical model has been developed to calculate the shear stress between the SWNT bundle and the cantilever surface, based on the measured axial slack. For a gold cantilever surface, an average interfacial shear stress of 113 MPa was obtained.
Starting Page	629
Ending Page	632
File Size	2074684
Page Count	4
File Format	PDF
ISBN	9781457701573
e-ISBN	9781457701566
DOI	10.1109/TRANSDUCERS.2011.5969785
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-06-05
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Gold Stress Carbon nanotubes Electron tubes Force Substrates shear stress SWNT NEMS cantilever
Content Type	Text
Resource Type	Article

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