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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Zhaohui Ou Feng Lin |
| Copyright Year | 2008 |
| Description | Author affiliation: Microelectron. R&D Center, Shanghai Univ., Shanghai (Zhaohui Ou; Feng Lin) |
| Abstract | CMOS image sensor has experienced explosive growth in recent years. As increasing of number of pixel scale and complexities of circuit, testability of image sensor chip has become an important problem that must be dealt with by both design and test engineers. A systematic approach to handle testability of CMOS image sensor circuits is urgently needed, because current test methods less address this domain. In this paper, a uniform and systematic approach is explored to the testability problem of CMOS image sensor, and it covers the image sensor defect analysis, fault model definition and test system design. The experimental data shows the fault coverage can be up to 99.3%. |
| Starting Page | 1 |
| Ending Page | 4 |
| File Size | 355273 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424427390 |
| DOI | 10.1109/ICEPT.2008.4607033 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2008-07-28 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Pixel CMOS image sensors Image sensors Circuit faults System-on-a-chip Photodiodes Noise |
| Content Type | Text |
| Resource Type | Article |
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